Aspectrics Showcases Revolutionary New EP-NIR Analyzer at PITTCON 2007

Aspectrics, Inc., the innovator of patented Encoded Photometric Infrared (EP-IR) spectroscopy technology, announces the launch of its new Encoded Photometric Near Infrared (EP-NIR) analyzer.

This novel Near-Infrared MultiComponent™ 2750 analyzer achieves an impressive spectral range of 1375-2750nm and an ultra fast scan speed of 100scans/second. Designed to enable users in the process industry to monitor their processes in real time, Aspectrics EP-NIR analyzer will be showcased on booth # 4417 at PITTCON® 2007, McCormick Place, Chicago, Illinois, February 25- March 2, 2007.

Also being displayed on booth # 4417 will be Aspectrics’ award-winning EP-IR analyzers. Recently presented with the R&D Top 100 Award, Aspectrics EP-IR MultiComponent™ Analyzer has been recognized as one of the top 100 most technologically significant products introduced into the marketplace in 2006. The EP-IR MultiComponent™ Analyzer was noted at the awards for its impressive spectral range, its 128 photometric channels and the fast scan rate of 100scans/second. Additionally, Aspectrics innovative analyzers include a standard suite of software solutions, resulting in quicker and more efficient real-time data acquisition, as well as instrument control, data play back and quantitation.

Moreover, Aspectrics innovative EP-IR analyzers have recently achieved military 202G Method 204D certification for successfully passing the High Frequency resistance Test. The test was performed to determine the effect of vibration on component parts of the analyzers in frequency ranges of 0.5 to 30 Hz. The units demonstrated no degradation in performance during or after the test compared to traditional Fourier Transform Infrared (FT-IR) systems. To view a video demonstrating this experiment, please visit the article webpage.