BURLE Announces Improved Ultra-Fast MCP TOF Detector for Mass Spec

5 Jul 2006
Kerry Parker
CEO

BURLE Electro-Optics, Inc., a PHOTONIS Group company announces the release of its Improved Ultra-Fast 2-micron pore MCP TOF Detector for Mass Spec applications.

This detector now incorporates the unique, patent pending MountingPad™ MCP technology, which significantly improves robustness and performance. It also virtually eliminates storage, flatness and cracking problems of the MCPs. This detector provides the highest detection sensitivity, dynamic range and temporal resolution available in the market with 350 ps pulse width and 250 ps rise time. These products are identical in form, fit and function to traditional products, which results in a seamless upgrade.

The design allows uniform expansion so the MCPs stay very flat, which eliminates distortion and increases performance. The MCPs are virtually warp-free, regardless of the storage environment. Simplified storage requirements allow this detector to be stocked for increased efficiency, shorter cycle times, and improved field service performance. Replacement is a snap with BURLE’s modular design and replaceable Quick-Fit®MCP cartridge. This module can be purchased separately and allows the operator to replace MCPs, quickly, easily and cost effectively.

The addition of the BURLE Electro-Optics Improved Ultra-Fast MCP TOF Detector rounds out the world’s largest selection of Time-of-Flight detectors with over 20 models in sizes ranging from 8 mm to 40 mm.

For general information, specifications and pricing please contact BURLE Electro-Optics at 1-800-648-1800, +1-508-347-4000, click 'request more info' or view the article webpage.

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