Ceram to Host ‘Surface Analysis Workshop’ on 22 October 2013

Ceram, the international materials technology company, will be holding a ‘Surface Analysis Workshop’ on Tuesday 22 October at its headquarters in Stoke-on-Trent.

As experts in surface, near surface and interface analysis, with state-of-the-art equipment and a wide range of techniques, Ceram will provide an introduction to various surface analysis techniques.

The Workshop will be split into a morning of presentations around the main techniques and industry applications, and an afternoon of laboratory demonstrations.

Presentation topics will include: Quantitative Surface Analysis by X-Ray Photoelectron Spectroscopy (XPS), Chemical Imaging by Secondary Ion Mass Spectrometry (ToFSIMS), Chemical Characterization of Layer Structure and Buried Interfaces by Dynamic Secondary Ion Mass Spectrometry (DSIMS), and Quantification of Surface Topography and Layer Thickness Measurement.

Delegates will have the opportunity to take a sample along for the technique demonstrations and/or for a one-to-one discussion with a member of Ceram’s surface science team.

The workshop will run from 9:30am - 5:00pm and has a registration fee of £150.00 + VAT (this will include refreshments and a buffet lunch).

For programme/further information and to register, click on the 'company website' link below.