Complete Platform Sets New Standard for Speed and Quality

Faster, better measurements

15 Sept 2015
Lois Manton-O'Byrne
Executive Editor

Designed for the industrial workflow, the Olympus DSX510 digital light microscope presents a new standard in speed and quality.

Incorporating the latest in optical and digital technologies, the DSX510 digital light microscope enables fast and detailed non-contact inspection and measurement, providing a complete investigation, measurement and reporting platform that meets the needs of the industrial workflow.

The DSX510 is part of the newly upgraded DSX series from Olympus, providing improved measurement results in a shorter time frame. Precise measurements are key to industrial applications, and building upon the existing accuracy and repeatability of measurements along the XY axis, measuring in the Z-plane is now unique in offering guaranteed repeatability. The system also provides enhanced workflow efficiency: the upgraded extended focal imaging (EFI) function boosts 3D acquisition speed by nearly a factor of two, while imaging of large samples is artefact-free thanks to the upgraded stitching function.

Accurate inspection no longer depends on in-depth microscopy knowledge with the intuitive operation of the DSX510, including easy-to-use touchscreen GUI and innovative digital tools such as the ‘Best Image’ function. Image acquisition is easy with a selection of preview images automatically generated for each observation technique, allowing even unexperienced users to quickly select the best imaging approach.

Key features

  • Faster Extended Focal Imaging (EFI) quickly generates fully focused images
  • Digital image stitching is artefact-free, enabling comprehensive analysis
  • Guaranteed precision along the XY, and now the Z axis
  • Operating simplicity combined with performance reliability
  • Best image function for easy image acquisition via touch panel

Key applications

  • Industrial inspection and measurement
  • Materials science
  • Quality control
  • 2D & 3D measurement

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