Demand drives launch of new batch of Whitehouse image analysis standards

6 Sept 2006

Sustained high demand has led Whitehouse Scientific to issue a new batch of the company’s NIST traceable glass microsphere standards for use with particle image analysis systems.

Four standards cover the range 50 to 5000 microns and are available in weights from 50 to 500 grams. They are calibrated by precision sieving methods and are traceable to international standards of length such as NIST and NPL. The standards have been developed to provide excellent resolution at the extremes of the size distribution.

Whitehouse Scientific’s managing director Dr Graham Rideal commented: “Particle characterisation by image analysis is becoming increasingly popular. It offers rapid analysis and provides unique information on particle shape. As a result we are seeing a high demand for standards which we anticipate will continue to grow.”

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