Hamamatsu Photonics has developed a GaN crystal evaluation system
The System uses ODPL spectroscopy to quantitatively evaluate GaN crystal quality.
8 Jul 2021Hamamatsu Photonics has developed a GaN (gallium nitride) crystal evaluation system “ODPL (omnidirectional photoluminescence) measurement system C15993-01” that leverages ODPL spectroscopy along with our unique light detection technologies including optical design and data processing.
This ODPL measurement system quantitatively evaluates the quality of GaN crystals that are currently drawing vast attention as a material for next-generation power semiconductors. This new system will prove a powerful tool for enhancing R&D efficiency to discover new ways to improve crystal quality.
Sales of this new ODPL measurement system start on Monday, August 2, 2021 for researchers at universities and semiconductor substrate manufacturers both in Japan and overseas. The system will be presented at the “SEMI Partner Search - For Power & Compound” online event, which is scheduled to take place Wednesday, July 14, 2021.
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