Imaging of Graphene with Confocal Raman and Atomic Force Microscopy (AFM)

The characterization of graphene requires nondestructive measuring tools to determine its properties. Confocal Raman-AFM is an effective tool for the study of nano-materials. This application note presents two examples that highlight the power of the alpha300 RA confocal Raman-AFM microscope system for the nondestructive characterization of grapheme.