Introducing JASCO's New FT-IR Microscopes for the FT/IR-4000/6000 Series

JASCO is proud to announce the release of two new FT-IR Microscope accessories, the IRT-5000 and IRT-7000, which can be easily interfaced with either JASCO’s FT/IR-4000 or FT/IR-6000 spectrometers. These microscopes feature innovative functions such as “Smart Mapping,” newly developed for infrared micro analysis and IR imaging.

The IRT-5000 is an FT-IR microscope system featuring dual detector capability and multiple objectives with excellent signal to noise ratio. The IRT-7000 is a multi-channel IR microscope for IR imaging, and with the combination of the FT/IR-6000 and step scan option offers an advanced capability for dynamic imaging as well as time-resolved measurements of a specific area.

In addition to high-performance and ease-of-use operations, both microscopes feature a “Smart Mapping” function as standard, which enables mapping analyses of a limited area without the use of an automated sample stage. By using the manual stage, mapping measurements, line measurements, multi-point analyses and ATR mapping can be easily performed in addition to single-point measurements. The “Smart Monitoring” function allows simultaneous viewing of the full sample image on the software display using an integrated high resolution CCD camera. An optional automatic X-Y-Z sample stage enables auto-focus and mapping analysis of a large sample area.

The IRT-5000
The IRT-5000 FT-IR Microscope employs a mid-band MCT detector as standard, while up to two detectors can be installed simultaneously. With the addition of a linear array detector, the microscope can be easily upgraded for IR imaging. In addition to the standard transmission and reflection measurements, optional ATR and grazing angle reflection objectives expand the capability of this FT-IR microscope system.

The IRT-7000
The IRT-7000 FT-IR microscope offers two detectors as standard, a 16-channel linear array detector and a single-point MCT detector. This combination with an automatic sample stage allows IR imaging of a specific area with extremely high spatial resolution and excellent sensitivity in a short time.