Investigate CIGS solar cells with ARL EQUINOX 100 X-ray Diffractometer and ARL QUANT'X EDXRF Spectrometer

The combination of X-ray diffraction (XRD) and energy dispersive X-ray fluorescence spectroscopy (EDXRF) is an effective method for quality control and research analysis of copper indium gallium selenide (CIGS) solar cells. In this application note, Thermo Fisher Scientific discusses the analysis of CIGS solar cells, an important material for thin-film solar cell technology. The Thermo Scientific™ ARL™ EQUINOX 100 X-ray Diffractometer is presented as a suitable instrument for fast screening of thin film samples using grazing incidence X-ray diffraction (GIXRD). The ARL EQUINOX 100 X-ray Diffractometer can perform a full GIXRD scan of CIGS solar cells within two-minute measurement time, which can distinguish between different structure types, the amorphous/crystalline character of the sample, and even between different layers in the same module.