LOT – Oriel and Pacific Nanotechnology announce the Nano-R2™- a new generation AFM system

LOT – Oriel and Pacific Nanotechnology, Inc. (PNI) announce their new generation AFM system. It uses enhanced hardware and software to deliver a productive, easy-to-use system.

The Nano-R2™ has many advanced features including dual LCD monitors, advanced image acquisition software and a new 16/32 bit controller architecture. The Nano-R2™ is compatible with all of the optional features available for the popular and well-established Nano-R™ which offered a stage heater, environmental cell, and NanoRule+ software. The Nano-R2™ is a multipurpose scanning probe microscope for capturing images and making measurements of structures on the nanometer scale. It has been optimized for both novice and expert users through having two versions of image acquisition software, X’pert™ and EZMode™.

Purchase of the Nano-R2™ provides the user with a complete package for AFM imaging. The master computer is backed with dual LCD monitors to visualize both the sample surface and probe while being able to interact with the control and analysis software. The system is completed with a control unit and theNano-R2™ stage unit.

Users may choose between the conventional Light Lever AFM-scanner and the advanced Crystal Force Microscope scanner. The LL-AFM is best suited to the visualization of nanostructures and making mode measurements while the CFM is ideal for routine topographic and metrology measurements.

Ease of probe replacement, alignment of probe and sample positioning with a high resolution color video optical microscope all go to make the system easy to learn to use, vital in the laboratory environment where being able to use many techniques as possible is the requirement for today’s materials characterization scientist.