NanoSight Adds Zeta Potential Measurement Capability to the Most Versatile Tool for Nanoparticle Characterization

NanoSight, world-leading manufacturers of unique nanoparticle characterization technology announce the release of Zeta Potential Analysis applying Z-NTA, particle by particle characterization of surface charge. Z-NTA will make its public debut at the US Pittsburgh Conference & Exposition being held in 2011 in Atlanta, Georgia from March 14th until 17th, booth #519.

Zeta Potential Nanoparticle Tracking Analysis (Z-NTA) adds measurement of surface charge to simultaneous reporting of size, composition (light scattering intensity), fluorescence and count. As with NTA, the core of NanoSight’s world-accepted nanoparticle measurement systems, it collects data on a particle-by-particle basis. No other methodology comes close to providing such simultaneous, multiparameter nanoparticle characterization.

Zeta potential is measured particle-by-particle, simultaneously for the complete sample population to provide data that is number weighted not intensity weighted. Size and light scattering intensity are also reported. Polydisperse and complex suspensions are readily characterized. No labelling is required but a fluorescence mode option is available to further differentiate suitable-labelled sub-populations. All data sets are validated by real time observation of particles moving under both electrophoretic and Brownian motion.

The user benefits are clear to define. Variations in zeta potential with size are analyzed with positively and negatively charged particles being reported separately even when they exist together. Sub-populations of similar sized particles of different materials, differentiated by their propensity to scatter light, are separately reported and counted. As with size distribution measurement, changes in Zeta Potential distribution with pH, concentration and temperature may be studied. Similarly, aggregation and flocculation may be studied quantitatively in real-time. Suitable labelling can highlight one sub-population for analysis despite high background noise.

With applications transcending the life sciences through the materials sciences, NanoSight have installed more than 300 systems worldwide as NTA-based characterization becomes increasingly accepted as the technique to quantitatively study nanoparticles. To learn more about nanoparticle characterization using Nanoparticle Tracking Analysis, NTA, please visit the company article page.

Malvern Instruments acquired NanoSight in September 2013.