New X-Ray Diffraction Solution for Investigation of Diverse Samples

2 Dec 2016
Lois Manton-O'Byrne
Executive Editor

Bruker AXS introduces the D8 ADVANCE Plus™– a new member of the D8 ADVANCE family of X-Ray Diffraction (XRD) solutions. The D8 ADVANCE Plus is designed to investigate epitaxial and polycrystalline thin films, large and oddly shaped bulk specimens, as well as micro- to macro-amounts of powder samples under ambient and non-ambient conditions.

The new TRIO™ optic is the key component of the new D8 ADVANCE Plus, combining the three most commonly used X-ray diffraction geometries in one single optic:

(1) divergent beam for X-Ray Powder Diffraction (XRPD),

(2) high intensity parallel beam for capillary experiments, height insensitive measurements, surface sensitive grazing incidence geometry, coating thickness determination and micro-diffraction, and

(3) pure Cu-Kα1 parallel beam for High-Resolution X- Ray Diffraction (HRXRD) of epitaxial thin films and low symmetry powder samples.

The TRIO optic features motorized switching between the three geometries and fully software--controlled instrument alignment - SmartCalibTM .

The D8 ADVANCE Plus is the latest extension to the well-established D8 ADVANCE Multipurpose SolutionsTM family, joining the D8 ADVANCE EcoTM for full-sized goniometer powder diffraction and the D8 ADVANCE TwinTM for maximum performance on polycrystalline powder and layered samples. The D8 ADVANCE family with DAVINCI DesignTM guarantees unlimited extension of capabilities to match all analytical needs - now and in the future.

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