Nikon to display next generation metrology and industrial microscopes at MDT 07 conference

28 Nov 2006

Offering greater accuracy, streamlined digital imaging and class-leading optics, Nikon’s next generation industrial and metrology microscopes, video measuring systems and digital cameras, will be displayed at the MDT 07 conference in Birmingham, UK stand F402.

Designed in response to ever more demanding inspection and production requirements, Nikon’s stereomicroscopes and metrology systems provide medical device manufacturers with the edge they need to improve quality control processes and enhance productivity.

In addition to the latest NEXIV video measuring system, Nikon will also display the new MM400 and MM800 series of manual metrology microscopes. These new systems harness a variety of innovative features such as through-the-lens laser autofocus (TTL Laser AF), automatic edge detection and white LED illumination to create the performance needed to meet the demands of modern digital metrology and imaging. The MM-400/800 Series models are the first Nikon measuring microscopes to be equipped with TTL Laser AF with a 0.75 μm spot diameter and 0.5 sec focusing speed. The instruments also feature non-contact, z-axis movement and a newly developed split-prism Focusing Aid (FA) which automatically corrects measurement errors caused by differences in the depth of focus between different objectives.

Visitors will also be able to experience Nikon’s LV Series of industrial microscopes. These can now be configured with a wider range of illuminators and focusing units – significantly increasing their scope to be customised for use within OEM applications. Award winning centerable CFI60 objectives and high mechanical quality serve to further refine images, which can then be captured using any of the many variants in the Nikon Series of camera systems.

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