Programmable XUV Spectrometer

Make direct optical measurements from one to 300 nanometers with the new Model 248/310 grazing incidence spectrometer from McPherson. Test your soft x-ray (XUV) high energy light sources (plasma or laser) and samples. Measure life time, persistence or decay with continuous spectral scanning.

A normal scan with diode or channel electron multiplier equipped instruments takes about twenty minutes. Resolve, clearly discern, record and store spectra and spectral events in the 1 to 300nm scanning range. New “up” scanning feature combines the 789A-3 digital drive and 248/310 spectrometer system accessories. Programming and presetting of scan ranges is possible. Investigation of spectral events in any wide or narrow range segment is programmable.

For example, analyze a hollow cathode discharge, or other plasma emission, for spectral content and decay within a pre-set scan range. Coordinate data collection at specific wavelengths with soft- or hardware triggers. Set wavelength scan region via software backed up by hardware. An optional adjustable end switch system for the 248/310 is available.

McPherson’s vacuum spectrometers are available in focal lengths of 0.2 to two meters and more. They are prepared for high-vacuum and also with all metal seals for ultra high vacuum applications. Accessories like light sources, detectors, and sample chambers are available. All vacuum compatible, calibrated sources and detectors too.