Rigaku Features Latest X-ray Analytical Instruments at the 2017 APS March Meeting

Rigaku Corporation will be attending the March 2017 American Physical Society (APS) meeting, representing its diverse range of X-ray analytical instrumentation. The meeting is taking place March 13-17 at the Ernest N. Morial Convention Center in New Orleans, Louisiana, USA.

A scientific program will be presented consisting of more than 105 invited sessions and approximately 600 contributed sessions at which over 9,600 papers will be presented.

Rigaku will be exhibiting in Hall J at the Convention Center at booth #333. Rigaku provides the world’s most complete line of X-ray diffraction (XRD) and X-ray fluorescence (XRF) instruments and components.

Systems include the Rigaku MiniFlex XRD and Supermini200 wavelength dispersive X-ray fluorescence (WDXRF) benchtop systems and the SmartLab multi-purpose diffractometer with small angle X-ray scattering (SAXS) and in-plane capabilities.