Rigaku introduces Supermini as the first commercial high-powered benchtop WDXRF spectrometer system

7 May 2008

Rigaku Americas Corporation today announced the introduction of the world's first high-powered benchtop wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system, the Rigaku Supermini. Delivering rapid, high-sensitivity, non-destructive analysis of elements from fluorine (F) through uranium (U) in solids, liquids, powders, and thin films, the new Rigaku Supermini offers performance and value in a compact package that has heretofore not been available in a commercial XRF elemental analyzer. Perfect for certifying compliance with RoHS/WEEE & ELV directives, the Rigaku Supermini affords high-precision analysis at the low concentration levels common to today's applications.

First shown at PITTCON 2008 in New Orleans, LA in March, the new Rigaku Supermini is offered as a compact sequential WDXRF that is both a cost-effective and high-precision, high-resolution alternative to energy dispersive X-ray fluorescence technology. Representing the next stage in the evolution of Rigaku's unique and historic line of "mini" X-ray instrumentation, this benchtop WDXRF employs three analyzing crystals, two detectors, a 12-position sample changer and a choice of analysis in an air, vacuum or helium (He) atmosphere. An air-cooled 50 kV, 200 W tube provides exceptional light element performance and does not require external cooling.

Rigaku Supermini fits between the low-cost Rigaku Primini 50 W benchtop sequential WDXRF spectrometer and the high-power Rigaku ZSX Primus "mainframe" sequential WDXRF spectrometer. The Supermini is part of the broadest line of laboratory XRF instruments available today, which affords the ability to provide an optimized high-value analytical solution for every conceivable XRF application. As with all Rigaku XRF instruments, the Rigaku Supermini is equipped with exceptionally powerful yet easy-to-use software, featuring: multiple sample handling, flowbar based application building, fundamental parameters (FP) and the EZ scan measurement user interface. Software options include: SQX software with FP, theoretical overlap correction, matching library, phase identification, glass bead correction and remote diagnostics.

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