Spectroscopic Ellipsometer: Did you measure all of the Data?

HORIBA Jobin Yvon introduces the MM16 Mueller Matrix spectroscopic ellipsometer to its product line of ellipsometric tools for advanced characterization of a broad range of materials and thin films for compounds, alloys, semiconductors, and organics.

The MM16 is exemplified by fast measurements, with no mechanical movements, of the Mueller matrix and determines the optical constants, thickness, surface characteristics, stoichiometry, compositional uniformity, crystallinity, and anisotropy/birefringence. With data acquisition times from 2 seconds, small form factor, and optional components for both ex-situ and in-situ configurations, the MM16 is now the most cost effective spectroscopic ellipsometer available for material analysis.