Veeco Introduces New NanoMan II

High-Resolution Imaging and Nanoscale Pulling Capability Aids in Nanoscience Research

Veeco Instruments Inc. has announced the release of the new NanoMan® II Atomic Force Microscope (AFM). The NanoMan II features a new, patented Hybrid XYZ scanner, offering the scientific research community the highest resolution imaging available on a large sample microscope. NanoMan is also able to perform highly accurate force curves, nanoindenting and “pulling techniques,” all of which are critical to today’s advanced nanoscience research applications. This new state-of-the-art AFM operates in closed-loop mode in all three axes, enabling a single instrument solution for nanolithography, nanomanipulation, and imaging for material and life science applications.

“The NanoMan II’s unique design offers up to six times lower Z sensor noise than any other commercial AFM system,” explains Ken Babcock, Ph.D., VP of Research and Development for Veeco Research AFM. “This superior performance sets a new standard for AFM imaging, and also allows true closed-loop in Z for more accurate pulling and nanoindenting. The NanoMan II uses our proven X/Y closed-loop design for the best imaging, lithography, and manipulation. And it is uniquely able to do all of this while maintaining the high bandwidth, scan speed, and noise immunity expected of our world-leading AFMs.”

Closed-loop feedback in the NanoMan II with Hybrid XYZ head provides precise X/Y control for nanomanipulation, with scans that are accurate and independent of X-Y offset and scan size/angle. The unique, integral flexure design ensures that the Z-axis remains orthogonal to the XY plane. With the latest in advanced engineering, the increased Z-height accuracy and repeatability require less frequent and less extensive calibration than is necessary with other scanners.

The instrument also supports the full spectrum of AFM modes, as well as Veeco’s electrical testing application modules, making this a highly flexible scanner for a wide range of advanced research applications.