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Webinar Highlights: Analysis of Emerging Contaminants

3 Jul 2016

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Microscope Stage for Precision Mapping of Large Samples

27 Jun 2016

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Hydraulic Mini-Pellet Press for 7mm Pellets

12 Jun 2016

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FRITSCH’s Variable Speed Rotor Mill PULVERISETTE 14 Premium Line Granted Two Awards

12 Jun 2016

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Webinar Highlights: Maximize Your Laboratory Safety: Best Practices for Your Lab Work

9 Jun 2016

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The New Zetasizer AT – Automated Online Nanoparticle Sizing for Process Monitoring

8 Jun 2016

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Shimadzu’s New Thermal-Damaged Plastics Library Supports Advanced FTIR Contaminant Analysis

1 Jun 2016

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Andor Launches New Superfast Detector for Nanosecond Time-Resolved Imaging

1 Jun 2016

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PlasmaQuant<sup>®</sup> PQ 9000 – A New Dimension of Spectral Resolution in ICP-OES

31 May 2016

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Hamamatsu Introduces New MEMS FPI Sensor

28 May 2016

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Webinar Highlights: Analysis of Emerging Contaminants

Microscope Stage for Precision Mapping of Large Samples

Hydraulic Mini-Pellet Press for 7mm Pellets

FRITSCH’s Variable Speed Rotor Mill PULVERISETTE 14 Premium Line Granted Two Awards

Webinar Highlights: Maximize Your Laboratory Safety: Best Practices for Your Lab Work

The New Zetasizer AT – Automated Online Nanoparticle Sizing for Process Monitoring

Shimadzu’s New Thermal-Damaged Plastics Library Supports Advanced FTIR Contaminant Analysis

Andor Launches New Superfast Detector for Nanosecond Time-Resolved Imaging

PlasmaQuant<sup>®</sup> PQ 9000 – A New Dimension of Spectral Resolution in ICP-OES

Hamamatsu Introduces New MEMS FPI Sensor

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Selected Filters:

Webinar Highlights: Analysis of Emerging Contaminants

Microscope Stage for Precision Mapping of Large Samples

Hydraulic Mini-Pellet Press for 7mm Pellets

FRITSCH’s Variable Speed Rotor Mill PULVERISETTE 14 Premium Line Granted Two Awards

Webinar Highlights: Maximize Your Laboratory Safety: Best Practices for Your Lab Work

The New Zetasizer AT – Automated Online Nanoparticle Sizing for Process Monitoring

Shimadzu’s New Thermal-Damaged Plastics Library Supports Advanced FTIR Contaminant Analysis

Andor Launches New Superfast Detector for Nanosecond Time-Resolved Imaging

PlasmaQuant<sup>®</sup> PQ 9000 – A New Dimension of Spectral Resolution in ICP-OES

Hamamatsu Introduces New MEMS FPI Sensor

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