Ultim Max and AZtecLive
AZtecLive and Ultim™ Max (Silicon Drift Detector) for EDS analysis, combine live electron images with live X-ray chemical imaging to allow a revolutionary change in how users investigate their sample...
Celebrating 60 years of scientific excellence and innovation, Oxford Instruments is committed to supporting research and industrial applications in order to develop a deeper understanding of the world through Science & Technology. Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, life science, metallurgy, and forensics. We are proud to be recognised as the leaders in what we do and for the difference we make in the world. Oxford Instruments NanoAnalysis continues to work on providing leading-edge tools to enable materials characterisation and sample manipulation at the nanometre scale. To learn more about our products and solutions, visit https://nano.oxinst.com/
AZtecLive and Ultim™ Max (Silicon Drift Detector) for EDS analysis, combine live electron images with live X-ray chemical imaging to allow a revolutionary change in how users investigate their sample...
Ultim Extreme Silicon Drift Detector is a breakthrough solution for ultra high resolution FEG-SEM applications and delivers solutions beyond conventional micro- and nano-analysis.
AZtecTEM, powered by Ultim™ Max (Silicon Drift Detector), provides exceptional elemental characterisation abilities in the TEM.
Celebrating 60 years of scientific excellence and innovation, Oxford Instruments is committed to supporting research and industrial applications in order to develop a deeper understanding of the world through Science & Technology. Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, life science, metallurgy, and forensics. We are proud to be recognised as the leaders in what we do and for the difference we make in the world. Oxford Instruments NanoAnalysis continues to work on providing leading-edge tools to enable materials characterisation and sample manipulation at the nanometre scale. To learn more about our products and solutions, visit https://nano.oxinst.com/
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