ecTOF
Highly confident compound identification with simultaneous EI & CI in GC-HRMS
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The ecTOF enhances analysis speed and instrument uptime as well as enables a faster and confident data post-processing. Suspect and non-targeted GC-HRMS analysis of complex samples gets to a new level of information content and simplicity.
Combining the parent ion information (via soft CI) and structural information via NIST-searchable fragment ion spectra (70 eV EI) in a single experiment largely reduces false positives and leads to a highly confident identification of even unknown compounds in any complex sample.
Furthermore, the ecTOF enhances analysis speed and instrument uptime as well as enables a faster and confident data post-processing. Targeted, non-targeted and suspect GC-HRMS analysis of complex samples is brought to a new level.