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EM-09100IS Ion Slicer™

Thin Film Specimen Preparation

JEOL USA

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The Ion Slicer prepares thin-film specimens faster and easier than conventional preparation tools. A low-energy, low-angle Ar ion beam irradiates the specimen while a thin shield belt allows low-angle irradiation of the Ar ion beam (from 0° to 6°), drastically reducing ion-beam irradiation damage to the specimen. The result is a high-quality thin film with few sputtering artifacts-even in soft materials and porous composites.

High quality TEM pre-treatment

  • Fast preparation
  • No complicated pre-treatments
  • Minimal surface damage

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