JEM-ARM300F2 GRAND ARM™2

The preferred choice for all aberration-corrected electron microscopy needs. Standard features include a cold field emission gun, a hybrid HAADF detector for increased S/N throughout the entire 40-300 kV operating range, and enhanced light element contrast via e-ABF imaging. Combining dual, large-area SDDs for high speed EDS with redesigned pole pieces enables atomic-resolution spectroscopy without sacrificing spatial resolution. The Grand ARM2 is the ultimate analytical S/TEM instrument with unparalleled flexibility.

• No compromise in spatial resolution - new pole piece design yields increased EDS solid angle without sacrificing resolution
• Mitigation of environmental effects - enclosure reduces impact of air flow, temperature changes, and acoustic noise
• Ultimate functionality with automated HT settings, corrector alignments, and optimized lens routines promote ease-of-use