Products & Review
JSM-6360LV Scanning Electron Microscope
JSM-6360LV Scanning Electron Microscope
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Great results
Application Area:
Analyze porous silicon samples
The product is effectiveness for my application and achieve high quality, it's easy to use
Review Date: 13 Apr 2023 | JEOL USA
Features:
- Accelerating Voltage from 0.5 ~ 30 kV
- High & low vacuum modes (HV & LV)
- High Magnification from 20x - 300,000x
- 3.0nm resolution (HV) / 4.0nm(LV)
- Z-motion from 5 ~ 48mm
- Stage tilt: -10° ~ +90°
- 360° continuous rotation
- Max specimen size 150 mm
- Everhart Thornley detector for SEI
- 3 segment solid state BEI detector
- JEOL SEM Imaging Software
- Data storage using USB Flash drive
- Excellent imaging for Biological sample, polymer, and material science applications
