JSM-IT200
Scanning Electron Microscope
Metal fracture surface (Kinectrics)
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Great results
Separation Technology
Excellent applications
Review Date: 13 Sept 2022 | JEOL USA
Compact, versatile Scanning Electron Microscope that provides great value with high throughput, high resolution imaging and unsurpassed low kV performance. Analytical models include "Live View" of EDS spectra in real time. Powerful software functionality, including automated image montaging, integrated management of image and analysis data, and automated report generation from all data ranging from collected SEM images to elemental analysis results.
