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JSM-IT700HR
Scanning Electron Microscope with exceptional fidelity at any kV
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The unique in-lens field emission gun and advanced electron optics deliver large probe currents while maintaining a small probe making this microscope ideally suited for imaging and analysis of nanostructures. This highly versatile SEM is compact in design yet is equipped with a large chamber and both High and Low Vacuum modes for managing a wide variety of specimen types in their native state. The JSM-IT700HR can be outfitted with our fully embedded EDS microanalysis system providing EDS spectrum in real time during image observation.
- In-lens field emission gun delivers ≥300nA to the specimen
- Aperture Angle Control Lens (ACL) for high resolution at any kV or probe current
- Advanced auto functions including beam alignment, focus, astigmatism correction
- High and Low Vacuum modes
- Large specimen chamber with multiple ports
- Mechanically eucentric, large, 5-axis automated specimen stage mounted in the chamber
- Navigation is easy with embedded color camera (Stage Navigation System)
- Zeromag simplifies navigation providing a seamless transition from the optical image to live SEM image. All data is linked for instant map of analysis positions.
- Live Analysis with integrated JEOL EDS
- Automated montage includes EDS maps (with JEOL EDS)
- SmileView Lab for data management and report generation
- Step-by-Step auto function guided operation for the new or occasional user
- Small footprint and easy maintenance (no cooling water required)