ZEISS Sigma
FE-SEM for high-quality imaging & advanced analytical microscopy
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A good choice for routine sample inspection
SEM imaging, FIB cross sectioning and lamella preparation
Reliable optics, good energy range and depth of focus, efficient detectors and add-ons. GUI complete, yet update-able
Review Date: 23 Jan 2023 | ZEISS Research Microscopy Solutions
The ZEISS Sigma family combines field emission scanning electron microscope (FE-SEM) technology with an excellent user experience. Structure your imaging and analysis routines and increase productivity. Study new materials, particles for quality inspection or biological or geological specimens. Make no compromises in high resolution imaging – go to low voltages and benefit from enhanced resolution and contrast at 1 kV or below. Execute advanced analytical microscopy using best-in-class EDS geometry and get analytical data at twice the speed and with more precision.
With the Sigma family you are entering the world of high-end nano-analysis.
- Sigma 360 is the core imaging facility’s choice — an intuitive FE-SEM for imaging and analytics.
- Sigma 560 uses best-in-class EDS geometry to deliver high throughput analytics and enable automated in situ experiments.
