Products & Reviews

Field Emission Cryo-electron Microscope

The new JMS-Q1600GC UltraQuad™ SQ-Zeta Single Quad Mass Spectrometer of JEOL is our 6th generation high-end Gas Chromatograph Quadrupole Mass Spectrometer (GC-QMS) based on JEOL's 50 years of MS technologies and experience.

High-throughput Analytical S/TEM

The MALDI SpiralTOF is a MALDI-TOF MS incorporating JEOL’s unique SpiralTOF™ ion optic system. Featuring unprecedented levels of mass resolution and sensitivity, the system has been acknowledged for its distinctive capabilities in various scientific studies.

The MStation™ is a fully-automated, high-performance, double-focusing magnetic sector mass spectrometer designed for high-resolution GC/MS analyses. The MStation is capable of achieving a resolving power of 60,000 or greater at 10% valley.

The JES-X330 provides high sensitivity with an easy operation environment.

The JES-X320 provides high sensitivity with an easy operation environment.

The JES-X310 provides high sensitivity with an easy operation environment.

Scanning Electron Microscope with exceptional fidelity at any kV

Ion Beam Cross Section Polisher (CP) 

Field Emission Auger Microprobe

Multibeam System

The JEOL JEM-1400 series 120kV Transmission Electron Microscope is widely accepted for its ease of use and high resolution imaging and analysis. Applications include pathology, biology, quality control, nanotechnology, polymer, and materials development.

The newest generation InTouchScope™ SEM enhances productivity with Simple SEM automation. Automated image collection at multiple locations and conditions simplifies workflow for the most routine tasks. Embedded Signal Depth display enhances understanding of analytical spatial resolution. Seamless navigation from optical to SEM imaging, Live EDS (both spectrum and X-ray maps) and auto functions from alignment to focus produce…

The ECZ Luminous (JNM-ECZL series) is an FT NMR spectrometer equipped with state-of-the-art digital and high frequency technology. The Smart Transceiver System, a high-speed, high-precision digital high-frequency control circuit, enables further miniaturization and high reliability of the spectrometer.

Cutting Edge in FIB sample preparation, imaging and analysis