HA_NC Etalon AFM Mode Contact Probe from K-TEK NanoK-TEK Nanotechnolgy's dual cantilever Etalon probe features: • High aspect ratio tip • Precisely specified resonant frequency • Enhanced reflection • Economic price Main characteristics of the HA_NC Etalon AFM Mode Contact Probe: • Standard chip size: 1.6x3.6x0.45 mm. • High reflective Au coating. • Typical curvature radius of a tip: 10 nm. • Total tip height : 9 - 16 µm. •…
K-TEK DCP11 Diamond Coated Probe - AFM Speciality Probe Ideal for AFM oxidation nanolithography, these conductive diamond coated probes offer a robust tip that will provide its user with the longevity and consistency needed.
K-TEK Nano DCP20 Probe- Speciality AFM Diamond Coated Probe The Diamond Coated AFM Probe is ideal for AFM oxidation nanolithography, these conductive diamond coated probes offer a robust tip that will provide its user with the longevity and consistency needed.
CSC05 AFM Mode Contact Probe The K-TEK CSC05 “Whisker Type” AFM probe is specially designed to study deep holes, trenches, and narrow gap. With the addition of a small “whisker” at the tip of the probe, users are able to investigate rather complicated surfaces with relative ease.
K-TEK Nano NSG01 DLC - AFM Non-Contact Diamond-Like Carbon (DLC) Probe Super sharp diamond-like carbon (DLC) tips with typical curvature radius of 1nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers. DLC tips provide users with a durable, long lasting product. To guarantee 20nm working length of DLC tips TEM is used. 10% from total number of probes in the batch are selected for…
K-TEK NSG10 - Diamond Like Carbon DLC AFM Non Contact Probes Super sharp NSG10 diamond-like carbon(DLC) AFM tips with typical curvature radius of 1nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers. DLC AFM tips provide users with a durable, long lasting product. NSG10 DLC AFM tip specification: Material – diamond-like carbon Curvature radius - 1-3nm. Working length - >20nm Probe…
K-TEK Nano Grating set TGS1 consists of 3 calibration gratings: TGZ1, TGZ2, TGZ3 TGZ series is intended for Z-axis calibration of scanning probe microscopes (SPM) and non-linearity measurements. Each grating offers a different step height. Now the calibration grating set TGS1 which consists of three gratings TGZ1, TGZ2, TGZ3 is available with PTB tracable certificate. Ordering grating set TGS1 with code TGS1_PTB you will get…
Grating set TGS2 consists of 6 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1 Fields of application for the TGS2 Calibration Grating Set: - Lateral and vertical calibration - Detection of lateral non-linearity - Detection of hysteresis, creep, and cross-coupling effects - Detection of angular distortion - 3-D visualization of the scanning tip - Determination of tip sharpness parameters (aspect ratio and curvature rad…
Grating set K-TEK Nano TGSFull consists of 8 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1, TDG1 Fields of application for the TGSFull Calibration Grating Set: - SPM simultaneous calibration of X, Y, and Z directions - Submicron SPM calibration in X or Y direction - Lateral and vertical calibration - Detection of lateral non-linearity - Detection of hysteresis, creep, and cross-coupling effects - Detection of…
K-TEK DNA Test Sample DNA01 is Plasmid pGem7zf+ (Promega), which is linearized with the SmaI endonuclease. Linear DNA molecules (3000 b. p.) are deposited at the freshly cleaved mica. Molecules are uniformly distributed over the surface with the molecular density - 0,5-7 molec./um2. The typical DNA length is 1009 nm. Recommended humidity for obtaining a good image is 3-5%. K-TEK Nano DNA Sample is perfect for: - Beginners lear…
