STEPP calibration sample from K-TEK Nano The Silicon Test Echeloned Pattern STEPP for AFM is designed on the base of silicon (111) surface with verified distribution of monoatomic steps as main calibrating inits for the complex control of AFM set up: • Height calibrating in angstrom and single nanometer intervals on the monoatomic steps; • Using the as the substrate for investigations of bio-objects, particulate matter and ot…
K-TEK Nano HOPG Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM HOPG piece has a top working layer with mosaic spread 0.4 - 0.7 degree and a base layer (about 1mm) with not specified mosaic spread quality. To mark the non-working HOPG piece side the one-side scotch is used. Available HO…
HOPG from K-TEK NanotechnologyHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM HOPG piece has a top working layer with mosaic spread 0.4 - 0.7 degree and a base layer (about 1mm) with not specified mosaic spread quality. To mark the non-working HOPG piece side the one-side scotch is used.
HOPG from K-TEK NanotechnologyHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM
HOPG from K-TEK NanotechnologyHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM
HOPG from K-TEK Nanotechnology -HOPG ZYH Quality - Mosaic Spread: 3.5 - 5 degreesHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM
TETRA 14 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 14 non-contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip c…
TETRA 15 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 15 non-contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip…
TETRA 16 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 16 non-contact probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip coati…
TETRA 17 AFM Mode: Contact Probe from K-TEK Nanotechnology The TETRA 17 contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is unmatched in its versatility. Accompanied by its bargain pricing and complementary Au tip coating, the T…
