Ultim® Extreme
Oxford InstrumentsUltim Extreme Silicon Drift Detector is a breakthrough solution for ultra high resolution FEG-SEM applications and delivers solutions beyond conventional micro- and nano-analysis.
Materials Products & Reviews
Materials analysis examines the properties, composition, and behavior of materials at a microscopic and macroscopic level. Using advanced techniques such as microscopy, spectroscopy, and chromatography, materials analysts investigate the structure, purity, and performance of various substances. From industrial materials and nanomaterials to battery testing and beyond, this field provides critical insights into the characteristics and applications of materials across industries such as manufacturing, electronics, and healthcare. Explore how materials analysis drives innovation, quality assurance, and product development for a wide range of applications.
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AZtecWave
Oxford InstrumentsCombining the X-ray peak resolution power of WDS with the speed of EDS, AZtecWave is a software solution that allows users with all levels of expertise to quantify minor and trace elements with ease.
OmniProbe 400
Oxford InstrumentsA ninth generation nanomanipulator, designed for optimum performance and flexibility.
Ultim Max and AZtecLive
Oxford InstrumentsAZtecLive and Ultim™ Max (Silicon Drift Detector) for EDS analysis, combine live electron images with live X-ray chemical imaging to allow a revolutionary change in how users investigate their samples in the SEM.
Ultim® Max and AZtecTEM
Oxford InstrumentsAZtecTEM, powered by Ultim™ Max (Silicon Drift Detector), provides exceptional elemental characterisation abilities in the TEM.
Xplore EDS detector
Oxford InstrumentsXplore is the next generation of EDS detector for routine analysis in the SEM.
Symmetry® S3
Oxford InstrumentsThe Symmetry S3 is the only genuine all-in-one EBSD detector on the market, and is based on the revolutionary Symmetry detector, the world’s first EBSD detector to utilise advanced CMOS technology.