New 6th-generation general purpose benchtop XRD system for phase identification and phase quantification. New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research,…
Rigaku ZSX Primus II delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Primus II features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases…
For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.Specifically d…
A fast and agile system for small molecule 3D structure analysis.
The Rigaku NEX CG II is a fast and powerful XRF spectrometer that pushes the boundaries of EDXRF technology
The Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing floor. With this in mind, the MiniFlex XpC allows you to process more samples faster, and to gain greater control over your process t…
The SmartLab is the most novel high-resolution diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert standing by your side. The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics (CBO), an in-plane…
The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements fast.With a multipurpose diffractometer, performance is measured by not only how fast you per…
The new generation in handheld Raman analysis that streamlines your material ID workflow. From the evolution of handheld spectroscopy arrives Progeny – the first handheld Raman analyzer designed to be customizable and flexible for seamless integration into any work environment. Now you can perform lab-quality analysis of the widest range of solids, powders, liquids, and other substances to ensure consumer safety around the gl…
The MicroMax™ 007 HF is the most widely used home lab X-ray source for protein crystallography. The original MicroMax™ 007 introduced the world to the concept of a sub-100 micron focal spot size along the increased brilliance that can be more effectively used to illuminate small crystals. The current HF version increases the power loading by 50% over the original model providing an X-ray source that rivals second generation s…
Rigaku ZSX Primus delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. The latest instrument in Rigaku's ZSX series, the ZSX Primus continues the tradition of delivering accurate results in a timely and seamless manner, with unsurpassed reliability, flexibility, and ease of use to meet any challenges i…
As a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control applications. Specifically designed for routine quality control elemental analysis applications, the new Rigaku NEX QC features an intuitive "icon-driven" touch screen inter…
Rigaku's NEX XT is the next generation process gauge for high-level total sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums.This versatile, compact and robust X-ray Transmission / Absorption (XRT / XRA) process gauge is specifically optimized for the total sulfur analysis needs of refineries, pipelines, blending operations, bunkering terminals and ot…
A compact, fully integrated high-resolution, small molecule crystallography system, the Rigaku R-AXIS RAPID II is the latest member of the RAPID family of large-area curved imaging plate (IP) X-ray diffraction systems. The RAPID II combines every component needed for a high-performance X-ray diffraction system delivering no-compromise performance for applications ranging from applied crystallography to chemical crystallograph…
Structural information for isotropically and anisotropically scattering particles. The S-MAX3000 pinhole SAXS camera design is available with a choice of conventional or high brilliance X-ray sources. A 3-meter, fully evacuated camera length provides both high intensity and high resolution.Coupled with a fully integrated 2-dimensional multi-wire proportional counter, the system is capable of making highly sensitive measuremen…
The new Supermini200 has improved software capabilities as well as a better footprint. As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COA) with high resolution and lower limits-of-detection (LLD). Not only is the Riga…
The FR-X was designed to be utilized in structural biology and material science, and provides the highest usable X-ray flux available for the laboratory researcher.The new design provides 20% more flux compared to the previous model as well as a new direct-drive anode that reduces maintenance expense considerably. The standard dual port design can be coupled with an optional dual wavelength anode to provide the ultimate in exp…
Rigaku ZSX Primus III+ delivers rapid quantitative determination of major and minor atomic elements, from oxygen (O) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Primus III+ features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases…
On-line, real-time analysis by Energy Dispersive X-ray Fluorescence (EDXRF). Featuring advanced 3rd generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX OL represents the next evolution of process elemental analysis for liquid stream and fixed position web or coil applications. Designed to span from heavy industrial through to food grade process gauging solutions, the NEX OL is configurable for u…
Designed for ultra-low level sulfur analysis of diesel, petrol (gasoline) and other fuels, the Rigaku Micro-Z ULS wavelength dispersive X-ray fluorescence (WDXRF) instrument features a novel design that measures both the sulfur peak and the back-ground intensity. The ability to measure and correct for changes in background intensity delivers a better net peak intensity measurement, resulting in superior calibrations and enhan…
Rigaku's WaferX 310 represents the culmination of 35 years of experience in the X-ray fluorescence analysis of thin films on silicon wafers. The WaferX 310 is ideal for measuring BPSG, PSG and metal films. In addition, thin film BPSG, multilayered circuit film, WSix, electrode films, ferrodielectric thin films, FRAM, next generation DRAM, and SiOF are standard applications for this tool.Highly accurate analyses for the ultral…
The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. Perform thickness, density, roughness & composition of films on blanket and patterned wafers. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.The MFM310 is designed with high-volum…
