Materials analysis examines the properties, composition, and behavior of materials at a microscopic and macroscopic level. Using advanced techniques such as microscopy, spectroscopy, and chromatography, materials analysts investigate the structure, purity, and performance of various substances. From industrial materials and nanomaterials to battery testing and beyond, this field provides critical insights into the characteristics and applications of materials across industries such as manufacturing, electronics, and healthcare. Explore how materials analysis drives innovation, quality assurance, and product development for a wide range of applications.
Agilent has discontinued the line of Cary 600 series infrared microscopy (Cary 610-FTIR) and chemical imaging systems (Cary 620-FTIR). This includes the Cary 610 and Cary 620 Microscopes and Cary 660 and Cary 670 spectrometers and relevant accessories.
The Agilent Cary WinFLR fluorescence software package for the Agilent Cary Eclipse fluorescence spectrophotometer provides instrument control and analysis capabilities for fluorescence, phosphorescence, chemiluminescence, and bioluminescence.
The Agilent C15 Component Leak Detector is a modular leak-testing package intended for applications in which the leak detector components are integrated into the system. It incorporates Agilent's Contra-Flow vacuum design, which maximizes the protection of its components from contamination in industrial applications. An optional color touch screen display is available for remotely showing all system status information and i…
The PHD-4 sniffer leak detector is a lightweight and rugged sniffer, sensitive to helium concentrations as low as 2 ppm – equivalent to a leak rate of 5 x 10–6 atm-cc/sec, far superior to bubble-testing, dye penetrants, and pressure decay. The sensitivity of the PHD-4 is enabled by Agilent’s proprietary and patented SIPD (Selective Ion Pump Detection) technology. With automatic startup, self-test and calibration, the PHD-4…
The worlds fastest and most sensitive CCD detector The Eos CCD is the fastest and most sensitive CCD detector for X-ray diffraction from Agilent or any manufacturer. With an active area of 92 mm diagonal and a gain of 330 e-/X-ray (Mo) the Eos is the highest sensitivity CCD detector available today. It is ideal for the most challenging experiments in small molecule crystallography, providing data collections faster…
The X-Cite® 200DC offers the ultimate combination of optical performance, short term stability and a built-in fast shutter. With the convenience and superior illumination uniformity found in all X-Cite® systems, the X-Cite® 200DC's intuitively easy-to-use design also includes light guide auto-detection to ensure optimized light coupling - every time. Novice and experienced microscopists will enjoy the flexibility provided by t…
The Qsurf is a dynamic BET surface area system designed to offer either single point or multipoint (6) determination of Surface area and total pore volume. The system is unique in that it works as well as a static system (better for low surface areas) and runs in just 15 minutes.
The Pascal systems are convenient benchtop Mersury intrusions systems small enough to operate from inside a fume hood. They offer unrivalled determination of Pore size andparticle distribution
The Sorpty 1990 is a static Gas Adsorbtion system for BET Surface area, Chemisorbtion, and pore analysis .
The Pycnomatic is a Helium Pycnometer with a difference. The system is fast to use and very accurate thanks to a built in peltier cooling system that ensures the analysis is carried out at a stable temperature.
