Materials analysis examines the properties, composition, and behavior of materials at a microscopic and macroscopic level. Using advanced techniques such as microscopy, spectroscopy, and chromatography, materials analysts investigate the structure, purity, and performance of various substances. From industrial materials and nanomaterials to battery testing and beyond, this field provides critical insights into the characteristics and applications of materials across industries such as manufacturing, electronics, and healthcare. Explore how materials analysis drives innovation, quality assurance, and product development for a wide range of applications.
The EMAT Adaptor GS1100 provides a means for current NDT users to benefit from the advantages of non-contact EMAT transducers for pulse-echo flaw detection and thickness guaging, without the large capital outlay of replacing existing piezoelectric based flaw inspection systems and thickness/corrosion monitors. It acts as a bridge between an EMAT probe and a detection system designed for piezoelectric transducers. Designed to w…
The light and compact ultrasonic wall thickness gauge SONOWALL 50 enables the precise measurement of the wall thickness of components made of metal, glass, ceramics and plastics. This efficient device allows the measurement of materials with both flat and curved surfaces. The wall thickness gauge enables the quick and simple detection of the first signs of wear and corrosion, for example, on ships, storage tanks, pipelines and…
The Helix-XT is an ultrasonic based system for inspecting ferrous and nonferrous tubes from the inside. It is based on the Internal Rotating Inspection System (IRIS), which can be applied on almost any material.With the Helix-XT, accurate thickness measurements can be taken at any location along the tube, so small changes in thickness are measurable and the exact location of pitting and corrosion can be determined.The system u…
Phased Array Ultrasonic Flaw DetectorFeatures include: Clear Image Linear Imaging Sector Imaging Accurate Flaw Position and Size Ultrasonic Imaging and A-scan DisplayFunctions include: Easy operation and user-friendly interface. Conventional and phased array modes are available in the same system, which is convenient for inspectors' testing and evaluation. Up to 32 channe…
TOFD Ultrasonic Flaw DetectorFeatures include; Touch Screen Operation Innovative Appearance Intuitive Interface Modular Design.
Fatigue-free 3D visual inspection of small parts and assembliesVDM-E/ZSquinting into a microscope eyepiece all day long for parts inspection can be very uncomfortable. That's why we developed the VDM system.Features: Stable metal stand with small footprint 150W illuminator Real-time color imaging on a 15" LCD monitorThe VDM-E/Z™ is available with two interchangeable optics options: Patented Extended Depth of Field…
Hollow Cathode Lamps for most Atomic Absorption SystemsSelect your lamps from our new interactive website at www.labhut.comSimply select the element you require from the periodic table, enter the model of spectrophotometer and the system will show the available lamps.Single or multi-element lamps, fully guaranteed, and backed with expert advice.
Hamamatsu’s brilliantly designed ORCA-Flash4.0 is truly a game changer in the world of scientific imaging. Built on a revolutionary new Gen II sCMOS detector, the ORCA-Flash4.0 is the first sCMOS camera that challenges the performance of all CCD, EM-CCD, and Gen I sCMOS cameras. With its combination of low noise and high quantum efficiency, the ORCA-Flash4.0 delivers unprecedented sensitivity as well as high dynamic range, bla…
Regardless of sample size, the Keysight 5600LS large-stage AFM is ready to deliver high-resolution results. The versatile 5600LS is the world’s only commercially available AFM that allows imaging of both large samples (in air) and small samples (in air, or in liquid under temperature control) with an AFM & STM scanner. The 5600LS utilizes a fully addressable 200mm x 200mm stage and a new, low-noise design. Samples up to 8”…
The Keysight 5500 inverted light microscope (ILM) system combines the power of a high-resolution atomic force microscope with the direct optical viewing capability of an inverted optical microscope. The system’s advanced design allows the AFM to sit on top of an inverted microscope and under the illumination pillar, resulting in better optical contrast for the images. The Keysight 5500 ILM offers unparalleled performance an…
