Materials Products & Reviews

High-resolution STEM imaging The Model 3000 Annular Dark Field (ADF) Detector is ideal for high-resolution scanning transmission electron microscopy (STEM) imaging. It allows simultaneous high angle ADF imaging and electron energy less spectroscopy (EELS). It has single electron detection capabilities and high quantum efficiency. The detector is pneumatically retractable from the beam path. Atomic-resolution imaging and Z-cont…

Provides clean environment for SEM The Cryo-Can provides a clean environment for SEM sample imaging and analysis. It helps eliminate chamber contamination resulting from sample outgassing and other sources. The Cryo-Can improves both imaging and analytical data quality. It is ideal for high beam current applications. Uses SEM vacuum system The Cryo-Can vacuum container is readily connected to one of the SEM chamber ports and d…

Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy (TEM) imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens. Targeted, ultra-low-energy NanoMillingsm proce…

High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any induced artifacts. In the Model 110 Twin-Jet Electropolisher, twin jets simultaneously polish both sides of the sample, creating electron transparent specimens within a few minutes. The Electropolisher features easily adjustable electrolyte fl…

Disposable cuvettes for spectrophotometry, optical PS visible range cuvettes, UV Grade PMMA cuvettes. Standard and semi-micro disposable cuvettes for spectroscopy made of optical PS and PMMA UV grade optical windows to achieve optimal transmittance through spectral range from 340 to 800 nm (OPS) an from 280 to 800 nm (PMMA UV qrade). The engineering and quality control determine the reproducibility of the cuvettes. These are s…

The PELCO® STEM imaging holder enables STEM imaging in the SEM by using the standard Everhart-Thornley SE detector in the SEM chamber. The standard 3mm TEM grid is placed in the grid holder and located under the scanning beam. The STEM image is created by the adjustable Pt conversion plate which must face the chamber SE-detector. Cost-effective method for STEM imaging by using the existing SE detector in the SEM chamber. The i…

Thermo Scientific QuasOr, the no compromise EBSD. Electron Backscatter Diffraction (EBSD) enables nanostructural analysis in the electron microscope by characterizing the crystalline structures which affect physical properties in a wide range of materials. As an integral part of the Thermo Scientific NORAN System 7, simultaneous acquisition of EBSD and EDS/WDS spectral images are performed with ease.

Dynamic light scattering based on the unique PCCS-technique for size and stability analysis of opaque nano-suspensions and emulsions from 0.5 nm to 10,000 nm

Ultrasonic extinction sensor for particle size and concentration analysis in highly concentrated suspensions and emulsions for process or laboratory applications from below 0.1 µm to 3,000 µm

Laser diffraction sensor for process particle size and distribution analysis of fine, even cohesive powders from 0.25 μm to 3,500 μm