SUGAR SP0810
Showa Denko Europe GmbHPolymer-based column for sugar analysis, using aqueous Size Exclusion (GFC) + Ligand exchange (LX) Chromatography
Materials analysis examines the properties, composition, and behavior of materials at a microscopic and macroscopic level. Using advanced techniques such as microscopy, spectroscopy, and chromatography, materials analysts investigate the structure, purity, and performance of various substances. From industrial materials and nanomaterials to battery testing and beyond, this field provides critical insights into the characteristics and applications of materials across industries such as manufacturing, electronics, and healthcare. Explore how materials analysis drives innovation, quality assurance, and product development for a wide range of applications.
Polymer-based column for sugar analysis, using aqueous Size Exclusion (GFC) + Ligand exchange (LX) Chromatography
Silica based Hybrid column, designed for Protein and Antibody analysis
Efficient and user-friendly data analysis for advanced mass spectrometry-based imaging and profiling experiment.
All-in-one software for accurate metabolic analysis through advanced mass spectrometry technology and software.
The Agilent Thermal Separation Probe (TSP) provides fast analysis of solid, liquid, and slurry samples. The process is simple, clean, and requires limited or zero sample preparation. Non-vaporized high boiling point ‘dirty sample matrix’– compounds, which can contaminate the GC liner and column, remain inside the micro-vial, and can be discarded after each injection. Use the TSP when testing complex samples in food, forensics,…
Speed, robustness and sensitivity: designed for the routine laboratories to deliver high accuracy and precision when analyzing complex sample matrices.
AZtecLive and Ultim™ Max (Silicon Drift Detector) for EDS analysis, combine live electron images with live X-ray chemical imaging to allow a revolutionary change in how users investigate their samples in the SEM.
AZtecTEM, powered by Ultim™ Max (Silicon Drift Detector), provides exceptional elemental characterisation abilities in the TEM.
Not all LIBS spectrometers are created equal. The Aurora LIBS Spectrometer—designed by the LIBS experts at Applied Spectra—delivers the high spectral resolution and precise gate timing control required for effective LIBS analysis.