Materials analysis examines the properties, composition, and behavior of materials at a microscopic and macroscopic level. Using advanced techniques such as microscopy, spectroscopy, and chromatography, materials analysts investigate the structure, purity, and performance of various substances. From industrial materials and nanomaterials to battery testing and beyond, this field provides critical insights into the characteristics and applications of materials across industries such as manufacturing, electronics, and healthcare. Explore how materials analysis drives innovation, quality assurance, and product development for a wide range of applications.
Grating set TGS2 consists of 6 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1 Fields of application for the TGS2 Calibration Grating Set: - Lateral and vertical calibration - Detection of lateral non-linearity - Detection of hysteresis, creep, and cross-coupling effects - Detection of angular distortion - 3-D visualization of the scanning tip - Determination of tip sharpness parameters (aspect ratio and curvature rad…
Grating set K-TEK Nano TGSFull consists of 8 calibration gratings: TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1, TDG1 Fields of application for the TGSFull Calibration Grating Set: - SPM simultaneous calibration of X, Y, and Z directions - Submicron SPM calibration in X or Y direction - Lateral and vertical calibration - Detection of lateral non-linearity - Detection of hysteresis, creep, and cross-coupling effects - Detection of…
K-TEK DNA Test Sample DNA01 is Plasmid pGem7zf+ (Promega), which is linearized with the SmaI endonuclease. Linear DNA molecules (3000 b. p.) are deposited at the freshly cleaved mica. Molecules are uniformly distributed over the surface with the molecular density - 0,5-7 molec./um2. The typical DNA length is 1009 nm. Recommended humidity for obtaining a good image is 3-5%. K-TEK Nano DNA Sample is perfect for: - Beginners lear…
STEPP calibration sample from K-TEK Nano The Silicon Test Echeloned Pattern STEPP for AFM is designed on the base of silicon (111) surface with verified distribution of monoatomic steps as main calibrating inits for the complex control of AFM set up: • Height calibrating in angstrom and single nanometer intervals on the monoatomic steps; • Using the as the substrate for investigations of bio-objects, particulate matter and ot…
K-TEK Nano HOPG Highly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM HOPG piece has a top working layer with mosaic spread 0.4 - 0.7 degree and a base layer (about 1mm) with not specified mosaic spread quality. To mark the non-working HOPG piece side the one-side scotch is used. Available HO…
HOPG from K-TEK NanotechnologyHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM HOPG piece has a top working layer with mosaic spread 0.4 - 0.7 degree and a base layer (about 1mm) with not specified mosaic spread quality. To mark the non-working HOPG piece side the one-side scotch is used.
HOPG from K-TEK NanotechnologyHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM
HOPG from K-TEK NanotechnologyHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM
HOPG from K-TEK Nanotechnology -HOPG ZYH Quality - Mosaic Spread: 3.5 - 5 degreesHighly oriented pyrolitic graphite (HOPG) allows users to obtain: - Critical Z resolution - Atomic resolution - Atomic smooth surface for placement of objects - Conductive samples for STM
TETRA 14 AFM Mode: Non Contact, Semi Contact Probe from K-TEK Nanotechnology The TETRA 14 non-contact AFM probe design allows for the optical viewing of the tip as it engages the samples surface, providing its user with superior targeting ability. Combined with its tetrahedral tip, standard Au backside and high aspect ratio, the TETRA series is extremely versatile. Accompanied by its bargain pricing and complementary Au tip c…
