Non-destructive techniques (NDT) describes a variety of analytical techniques used to evaluate the properties of a material. Common methods include ultrasonic, magnetic-particle, liquid penetrant, radiographic, remote visual inspection (RVI), and eddy-current testing. NDT is regularly used in forensic engineering, civil engineering, mechanical engineering, electrical engineering, systems engineering, aeronautical engineering, and medicine.
Phased Array Ultrasonic Flaw DetectorFeatures include: Clear Image Linear Imaging Sector Imaging Accurate Flaw Position and Size Ultrasonic Imaging and A-scan DisplayFunctions include: Easy operation and user-friendly interface. Conventional and phased array modes are available in the same system, which is convenient for inspectors' testing and evaluation. Up to 32 channe…
TOFD Ultrasonic Flaw DetectorFeatures include; Touch Screen Operation Innovative Appearance Intuitive Interface Modular Design.
Fatigue-free 3D visual inspection of small parts and assembliesVDM-E/ZSquinting into a microscope eyepiece all day long for parts inspection can be very uncomfortable. That's why we developed the VDM system.Features: Stable metal stand with small footprint 150W illuminator Real-time color imaging on a 15" LCD monitorThe VDM-E/Z™ is available with two interchangeable optics options: Patented Extended Depth of Field…
MicroXCT-200 - High Resolution and Contrast; Large Sample Size and Shape Flexibility; Automated Multiple Point Imaging. The MicroXCT-200 is a versatile 3D X-ray imaging system suited for non-destructive analysis of a large variety of samples. Its unique design allows for high resolution imaging for relatively large samples. Its detectors are tailored to image both high and low absorption materials. The MicroXCT-200 provides t…
UltraXRM-L200 - Synchrotron-like 3D Imaging in a Laboratory System. The UltraXRM-L200 is the only lab based ultra-high resolution CT scanner for 3D visualization of microscopic sample volumes. Xradia's precision X-ray focusing optics deliver a resolution as fine as 50 nm, seamlessly extending the capabilities of X-ray CT beyond those of conventional scanners. Integrated Zernike phase contrast imaging enhances the visibility o…
VersaXRM-410 - High Resolution and Contrast; Industry-leading 4D and In Situ Capabilities for Flexible Sample Sizes and Types.The VersaXRM-410 encompasses all the benefits of the VersaXRM family of 3D X-ray microscopes for computed tomography. The VersaXRM-410 is uniquely designed to bridge cost/performance standards for a broad range of scientific research. It offers Resolution at a Distance (RaaD™), proprietary Xradia techno…
VersaXRM-500 - Industry's largest working distance at highest resolution. The Xradia VersaXRM™ family is the latest generation of 3D X-ray microscopy (XRM) solutions optimized for non-destructive micro tomography. The VersaXRM-500 advances industry and science with a versatile combination of world-leading resolution and contrast, sample flexibility and the large working distance required to address emerging research challen…
UltraXRM-S200/220 - Energy-tunable, Ultra-high Resolution 3D X-ray Microscopy For Synchrotron Facilities.The UltraXRM-S series harnesses the powerful X-ray beams produced by synchrotron radiation facilities for ultra-high resolution 3D X-ray microscopy. Combined with the superior X-ray imaging technology developed for the laboratory-based UltraXRM-L, the UltraXRM-S series is capable of producing 3D images with 30 nm resolution…
UltraSPX-200/220 - Ultra-high Resolution Analytical Scanning-Probe X-ray Microscope for Synchrotron Facilities. The UltraSPX-S series takes advantage of the coherent X-ray beams available at modern synchrotron light sources to bring established X-ray analytical techniques, such as X-ray fluorescence, spectroscopy, and diffraction down to the nanometer scale. Xradia's high-performance proprietary X-ray optics employed in the U…
Xradia 810 Ultra increases the throughput of nanoscale, three-dimensional X-ray imaging by up to a factor of 10. This innovative X-ray microscope (XRM) operates at 5.4 keV, a lower energy that delivers better contrast and image quality for medium to low Z samples and other materials used throughout science and industry. Better contrast enables higher-quality tomographies to be acquired an order of magnitude faster while achie…
