A new class of atomic force microscope: FX40, the automatic AFM

This technical note demonstrates the innovative design, ease of operation, and superior imaging capabilities of the new Park FX40. This automatic Atomic Force Microscope (AFM) system is designed to acquire high-quality images fast, using novel features such as machine learning and pattern recognition, QR-code based tip selection, and fully automatic tip exchange and alignment. This technical note describes the imaging process from beginning to end and illustrates it with real-world application examples.