Atomic force microscopy for materials

In this application note, Bruker introduces atomic force microscopy (AFM), describes its primary imaging modes, and gives a brief introduction to the main secondary modes. Plus, some of the challenges involved in studying inorganic materials are explained, including preparing samples for AFM scanning and selecting the right tip. Finally, it looks at how newer AFM instruments are providing faster imaging, a larger selection of modes, and quantitative surface characterization of material samples.