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Capturing the full potential: Surface potential imaging of soft structures via sideband KPFM

Park Systems
5 Aug 2020

This application note by Park Systems compares the KPFM measurements of self-assembled F14H20 structures imaged by two techniques: Off-resonance and Park’s newly implemented sideband KPFM.

Links

Park SystemsCompany website

Tags

Atomic Force Microscopy / Scanning Tunneling MicroscopyMicroscopyAFM

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