DektakXT Stylus Profiler

In this application note, Bruker Nano provides a detailed overview of the DektakXT^® Stylus Profiler. Offering high-quality performance, ease of use, and value, the DektakXT is designed to facilitate better process monitoring from R&D to QC. Dektak^® innovation enables critical nanometer-level surface measurements for the microelectronics, semiconductors, solar, high-brightness LED, medical, and materials science industries.