ResourceSpectroscopy
F963 Testing with HDXRF<sup>®</sup>
17 May 2016This application note describes a study which demonstrates the accuracy and precision of HDXRF® technology for various substrate materials at levels near and below the ASTM F963-11 restricted limits. The samples used included three different plastics and three different metals.
Tags
Sample Preparation Atomic Absorption / Emission Spectroscopy Heating EquipmentParticle Characterization Thermal Analysis Equipment Mechanical Testing Specific Heat CapacityThermal ProcessesContamination PreventionPolymeric MaterialsLaboratory SafetyElemental AnalysisOxidation StabilitySpectroscopyMetals