Improved Gun Shot Residual Analysis

Scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS) are well established techniques for the classification of gunshot residue (GSR) in forensic examinations. However, they are often not sufficient to clearly distinguish between GSR and environmental particles. In this application note discover how combining SEM and EDS with focused ion beam and electron backscatter diffraction analysis can provide more accurate and reliable GSR characterization.