Intrinsic electrical characterization of two-dimensional transition metal dichalcogenides via scanning probe microscopy

Suitable techniques to characterize the intrinsic physical and electrical properties of as-deposited 2D materials, are a key link between the quality of as-deposited 2D materials and the performance of 2D materials-based electronic devices. In this application note, Park Systems investigates the intrinsic electrical properties of as-deposited 2D TMDs, utilizing scanning probe microscopy (SPM).