ResourceMaterials

Making the connection: Atomic force microscopy correlates Graphene's functional properties on the nanoscale

19 May 2021

Download this application note to discover how a combination of different AFM techniques allows a holistic and in-depth characterization of 2D materials as demonstrated on a wafer-scale CVD-grown graphene on sapphire produced in an Aixtron CCS R&D reactor.

Links

Tags