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Nanobeam 4D STEM with MerlinEM - The intersection between crystallography and microscopy

15 Oct 2025

Extracting nanoscale crystallographic insights from beam-sensitive materials remains a challenge in advanced microscopy. Nanobeam 4D STEM offers a powerful solution for orientation, phase, and strain mapping.

Explore how the MerlinEM direct electron detector enables high-resolution diffraction pattern acquisition with fast readout and dynamic range, advancing structural analysis across diverse materials, from irradiated memory films to organic nanoparticles.

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