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Next Generation Laser Diffraction Particle Size Analysis With the LS 13 320 XR

Improve your analysis with enhanced PIDS technology and extended measurement range

3 Apr 2018

With an expanded measurement range of 10nm-3000um, and enhanced Polarization Intensity Differential Scattering (PIDS) technology, the LS 13 320 XR laser diffraction particle size analyzer by Beckman Coulter provides higher resolution and more precise measurement of particle size analysis. Furthermore, new software with an intuitive interface provides data you need with only a few clicks. This brochure provides you with detailed product specifications to enable you to make a more informed purchasing decision.

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