Orthogonal and Complementary Nanoparticle Characterization Techniques for Particle Measurement

How can I trust my data? This is a common concern for many researchers using particle measurement instrumentation. Is the data affected in any way by the measurement technology, or alternatively by the user during sample preparation or by the analysis parameters employed? To answer this question, the use of independent and orthogonal measurement techniques in order to provide confidence and measurement validation must be considered.