Probing Organic Self-Assembled Monolayers (SAMs) on Silicon by FTIR with Single Reflectance ATR

This application note shows that FTIR-ATR is a convenient and reliable analytical technique to monitor the formation and modification of SAMs on silicon substrates. Compared to conventional surface analytical tools, presented single reflectance FTIR-ATR using a Ge crystal provides a feasible and convenient way to obtain finger prints of SAMs on silicon substrates.